Defect Identification in High-Purity Semiconductors
نویسندگان
چکیده
منابع مشابه
Defect identification in semiconductors with positron annihilation: Experiment and theory
Rights: © 2013 American Physical Society (APS). This is the accepted version of the following article: Tuomisto, Filip & Makkonen, Ilja. 2013. Defect identification in semiconductors with positron annihilation: Experiment and theory. Reviews of Modern Physics. Volume 85, Issue 4. 1583-1631. ISSN 0034-6861 (printed). DOI: 10.1103/revmodphys.85.1583, which has been published in final form at http...
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ژورنال
عنوان ژورنال: MRS Proceedings
سال: 1985
ISSN: 0272-9172,1946-4274
DOI: 10.1557/proc-46-495